Correlation considerations: Real HBM to TLP and HBM testers

Author

Barth, Jon ; Richner, John

Author_Institution

Barth Electron., Inc., Boulder City, NV, USA

fYear

2001

fDate

11-13 Sept. 2001

Firstpage

448

Lastpage

455

Abstract

This paper discusses the previously unexplored initial front rise differences between Real HBM, TLP and HBM tester waveshapes. The dV/dt of the HBM test pulse amplitude below 2% has been shown to affect the high current immunity of Snapback type ESD protection circuits, and should replace the present time specification for a high voltage HBM pulse to rise from 10% to 90% of the peak amplitude, commonly known as risetime.

Keywords

electrostatic discharge; integrated circuit testing; waveform analysis; HBM test pulse amplitude; HBM tester; Snapback type ESD protection circuits; TLP tester; high current immunity; real HBM discharges; Circuit testing; Cities and towns; Drives; Electronic equipment testing; Electrostatic discharge; Immunity testing; Protection; Pulse circuits; Semiconductor device testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD '01.

Conference_Location

Portland, OR

Print_ISBN

978-1-5853-7039-9

Electronic_ISBN

978-1-5853-7039-9

Type

conf

Filename

5254934

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=501864