Title :
Correlation considerations: Real HBM to TLP and HBM testers
Author :
Barth, Jon ; Richner, John
Author_Institution :
Barth Electron., Inc., Boulder City, NV, USA
Abstract :
This paper discusses the previously unexplored initial front rise differences between Real HBM, TLP and HBM tester waveshapes. The dV/dt of the HBM test pulse amplitude below 2% has been shown to affect the high current immunity of Snapback type ESD protection circuits, and should replace the present time specification for a high voltage HBM pulse to rise from 10% to 90% of the peak amplitude, commonly known as risetime.
Keywords :
electrostatic discharge; integrated circuit testing; waveform analysis; HBM test pulse amplitude; HBM tester; Snapback type ESD protection circuits; TLP tester; high current immunity; real HBM discharges; Circuit testing; Cities and towns; Drives; Electronic equipment testing; Electrostatic discharge; Immunity testing; Protection; Pulse circuits; Semiconductor device testing; Voltage;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD '01.
Conference_Location :
Portland, OR
Print_ISBN :
978-1-5853-7039-9
Electronic_ISBN :
978-1-5853-7039-9
