Title :
The application of Transmission Line Pulse testing for the ESD analysis of integrated circuits
Author :
Smedes, T. ; Velghe, R.M.D.A. ; Ruth, R.S. ; Huitsing, A.J.
Author_Institution :
Philips Semicond., Nijmegen, Netherlands
Abstract :
TLP, well known for device characterisation, applied to full integrated circuits offers valuable data for analysis of ESD behaviour. TLP is the only method to study ESD behaviour during zapping and as such provides knowledge about actual ESD current paths. As illustrated by examples, this gives valuable suggestions for improving circuit designs.
Keywords :
electrostatic discharge; integrated circuit design; integrated circuit testing; transmission line matrix methods; ESD analysis; integrated circuits; transmission line pulse testing; Application specific integrated circuits; Circuit analysis; Circuit testing; Distributed parameter circuits; Electrostatic discharge; Integrated circuit testing; Protection; Pulse circuits; Transmission lines; Voltage;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD '01.
Conference_Location :
Portland, OR
Print_ISBN :
978-1-5853-7039-9
Electronic_ISBN :
978-1-5853-7039-9
