Title :
Comparison of solutions to minimize voltages induced by ESD events on adjacent microstrips
Author_Institution :
Littelfuse, Inc., Des Plaines, IL, USA
Abstract :
This paper discusses the effects of ESD pulsed microstrip lines on adjacent lines. Even though a line may be insensitive to ESD events, voltages can couple to adjacent, sensitive lines. These induced voltages may result in temporary of permanent system malfunction. Five different solutions to this problem will be discussed.
Keywords :
electrostatic discharge; microstrip lines; ESD pulsed microstrip line; adjacent microstrips; electrostatic discharge; voltage induction; Coupling circuits; Crosstalk; Current density; Electrostatic discharge; Microstrip; Power system protection; Printed circuits; Road transportation; Varistors; Voltage;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD '01.
Conference_Location :
Portland, OR
Print_ISBN :
978-1-5853-7039-9
Electronic_ISBN :
978-1-5853-7039-9
