DocumentCode :
501912
Title :
Modular, portable, and easily simulated ESD protection networks for advanced CMOS technologies
Author :
Torres, Cynthia A. ; Miller, James W. ; Stockinger, Michael ; Akers, Matthew D. ; Khazhinsky, Michael G. ; Weldon, James C.
Author_Institution :
Motorola, Inc., Austin, TX, USA
fYear :
2001
fDate :
11-13 Sept. 2001
Firstpage :
81
Lastpage :
94
Abstract :
This paper introduces a new distributed active MOSFET rail clamp network that offers surprising advantages in layout area efficiency, bus resistance tolerance, design modularity and ease of reuse. SPICE simulation results using an extended vertical PNP bipolar transistor compact model and a new method for optimizing distributed rail clamp networks are presented along with chip-level test results.
Keywords :
MOSFET; SPICE; electrostatic discharge; ESD protection networks; SPICE simulation results; advanced CMOS technologies; chip-level test results; distributed active MOSFET rail clamp network; extended vertical PNP bipolar transistor compact model; Bipolar transistors; CMOS technology; Clamps; Electrostatic discharge; MOSFET circuits; Optimization methods; Protection; Rails; SPICE; Semiconductor device modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD '01.
Conference_Location :
Portland, OR
Print_ISBN :
978-1-5853-7039-9
Electronic_ISBN :
978-1-5853-7039-9
Type :
conf
Filename :
5254985
Link To Document :
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