Title :
On-Wafer Noise Measurement at 300 GHz Using UTC-PD as Noise Source
Author :
Ho-Jin Song ; Yaita, Makoto
Author_Institution :
Microsyst. Integration Labs., NTT Corp., Atsugi, Japan
Abstract :
We demonstrate on-wafer noise measurement based on the Y-factor technique at 300 GHz utilizing a uni-traveling-carrier photodiode (UTC-PD) as a noise source. Since the UTC-PD can provide high and scalable noise power for the hot state and has a waveguide output port, easy and reliable measurement is available even at terahertz frequencies, where the loss from the experiment setup is not ignorable. We describe the experimental procedure with the UTC-PD as a noise source and a diode mixer as a noise receiver and present a noise figure measurement for a 300 GHz amplifier MMIC in an on-wafer environment. In addition, we discuss the uncertainty due to using the UTC-PD.
Keywords :
MMIC amplifiers; electric noise measurement; integrated circuit noise; millimetre wave amplifiers; millimetre wave diodes; millimetre wave measurement; millimetre wave mixers; photodiodes; submillimetre wave amplifiers; submillimetre wave diodes; submillimetre wave measurement; submillimetre wave mixers; waveguides; UTC-PD; V-factor technique; amplifier MMIC; diode mixer; frequency 300 GHz; noise receiver; on-wafer noise measurement; unitraveling-carrier photodiode; waveguide output port; Noise; Noise measurement; Optical attenuators; Optical waveguides; Probes; Receivers; Temperature measurement; Noise figure (NF); Y-factor measurement; on-wafer noise measurement; terahertz (THz) amplifier MMIC; uni-traveling-carrier photodiode (UTC-PD);
Journal_Title :
Microwave and Wireless Components Letters, IEEE
DOI :
10.1109/LMWC.2014.2324762
