HBM tester parasitic effects on high pin count devices with multiple power and ground pins

Author

Chaine, M. ; Meuse, T. ; Ashton, R. ; Henry, L.G. ; Natarajan, M.T. ; Barth, J. ; Ting, L. ; Gieser, H. ; Voldman, S. ; Farris, M. ; Grund, E. ; Ward, S. ; Kelly, M. ; Gross, V. ; Narayan, R. ; Johnson, L. ; Gaertner, R. ; Peachey, N.

Author_Institution

Micron Technol., Inc., Boise, ID, USA

fYear

2006

fDate

10-15 Sept. 2006

Firstpage

354

Lastpage

363

Abstract

A new human body model (HBM) SPICE equivalent lumped element model (LEM) circuit that reproduces parasitic resistance, capacitance and inductance (RLC) tester effects has been used to investigate how the HBM current flows through several different relay-matrix HBM simulators. SPICE analysis shows that unwanted interaction between the simulators RLC parasitics and the IC component could be significantly reduced, if all of the HBM current flowed through the primary ground path and not through parasitic current paths unintentionally built inside the HBM simulators.

Keywords

RLC circuits; SPICE; circuit testing; counting circuits; equivalent circuits; lumped parameter networks; HBM current flows; HBM tester parasitic effects; IC component; SPICE equivalent lumped element model circuit; ground pins; high-pin count devices; human body model; parasitic current paths; parasitic resistance-capacitance-inductance tester effects; relay-matrix HBM simulators; Analytical models; Biological system modeling; Circuit simulation; Circuit testing; Humans; Immune system; Parasitic capacitance; Pins; RLC circuits; SPICE;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD '06.

Conference_Location

Anaheim, CA

Print_ISBN

978-1-5853-7115-0

Type

conf

Filename

5256759