Title :
HBM tester parasitic effects on high pin count devices with multiple power and ground pins
Author :
Chaine, M. ; Meuse, T. ; Ashton, R. ; Henry, L.G. ; Natarajan, M.T. ; Barth, J. ; Ting, L. ; Gieser, H. ; Voldman, S. ; Farris, M. ; Grund, E. ; Ward, S. ; Kelly, M. ; Gross, V. ; Narayan, R. ; Johnson, L. ; Gaertner, R. ; Peachey, N.
Author_Institution :
Micron Technol., Inc., Boise, ID, USA
Abstract :
A new human body model (HBM) SPICE equivalent lumped element model (LEM) circuit that reproduces parasitic resistance, capacitance and inductance (RLC) tester effects has been used to investigate how the HBM current flows through several different relay-matrix HBM simulators. SPICE analysis shows that unwanted interaction between the simulators RLC parasitics and the IC component could be significantly reduced, if all of the HBM current flowed through the primary ground path and not through parasitic current paths unintentionally built inside the HBM simulators.
Keywords :
RLC circuits; SPICE; circuit testing; counting circuits; equivalent circuits; lumped parameter networks; HBM current flows; HBM tester parasitic effects; IC component; SPICE equivalent lumped element model circuit; ground pins; high-pin count devices; human body model; parasitic current paths; parasitic resistance-capacitance-inductance tester effects; relay-matrix HBM simulators; Analytical models; Biological system modeling; Circuit simulation; Circuit testing; Humans; Immune system; Parasitic capacitance; Pins; RLC circuits; SPICE;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD '06.
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-5853-7115-0
