• DocumentCode
    502576
  • Title

    Different CDM ESD Simulators provide different failure thresholds from the same device even though all the simulators meet the CDM standard specifications

  • Author

    Henry, L.G. ; Narayan, R. ; Johnson, L. ; Hernandez, M. ; Grund, E. ; Kyungjim Min ; Yoon Huh

  • Author_Institution
    ESD/TLP Consultants, Fremont, CA, USA
  • fYear
    2006
  • fDate
    10-15 Sept. 2006
  • Firstpage
    343
  • Lastpage
    353
  • Abstract
    Existing CDM Standards allow the use of limited bandwidth oscilloscopes that are unable to capture the true CDM discharge waveforms. This limitation allows significantly different pulses from different testers to meet the standards, resulting in inconsistent results from stressed devices. Different failure thresholds have been obtained from the same devices using different testers that all comply with the industry CDM standards.
  • Keywords
    electron device testing; electrostatic discharge; CDM ESD simulators; limited bandwidth oscilloscopes; Bandwidth; Capacitance; Circuit testing; Earth Observing System; Electrostatic discharge; Equations; Integrated circuit modeling; Measurement standards; Oscilloscopes; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD '06.
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    978-1-5853-7115-0
  • Type

    conf

  • Filename
    5256762
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=502576