DocumentCode :
502603
Title :
Thermal characteristics of a PtMn GMR sensor subjected to square wave EOS pulses
Author :
Iben, I.E.T.
Author_Institution :
IBM, San Jose, CA, USA
fYear :
2006
fDate :
10-15 Sept. 2006
Firstpage :
120
Lastpage :
130
Abstract :
Electrical overstress (EOS) pulses between 50 ns to 24 hours were applied to GMR stripes with a synthetic PtMn antiferromagnet (AFM) and a permalloy free layer. The temperature dependence of the sensors versus power and pulse width was measured and a simple phenomenological model was developed to analytically determine the stripe temperature. Temperatures of 1260plusmn90degC for melting and 572plusmn66degC for AFM flip were measured. Temperature for the creation of domains was measured at 603plusmn113 and 516plusmn78degC for forward and reverse bias pulses respectfully. Activation energies of 1.2plusmn.2 and 3.0plusmn.3 eV were observed for resistance changes. Irreversible Magnetic degradation exhibited activation energies of 2.4plusmn.3 eV below and 2.7plusmn.3 eV above about 500degC.
Keywords :
Permalloy; atomic force microscopy; magnetoresistive devices; manganese alloys; melting; platinum alloys; sensors; temperature measurement; AFM flip; GMR sensor; PtMn; activation energy; electrical overstress; forward bias; magnetic degradation; melting; permalloy free layer; phenomenological model; reverse bias; square wave EOS pulses; synthetic antiferromagnet; thermal characteristics; time 50 ns to 24 h; Antiferromagnetic materials; Earth Observing System; Electrical resistance measurement; Power measurement; Pulse measurements; Sensor phenomena and characterization; Space vector pulse width modulation; Temperature dependence; Temperature sensors; Thermal sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD '06.
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-5853-7115-0
Type :
conf
Filename :
5256789
Link To Document :
بازگشت