DocumentCode
502603
Title
Thermal characteristics of a PtMn GMR sensor subjected to square wave EOS pulses
Author
Iben, I.E.T.
Author_Institution
IBM, San Jose, CA, USA
fYear
2006
fDate
10-15 Sept. 2006
Firstpage
120
Lastpage
130
Abstract
Electrical overstress (EOS) pulses between 50 ns to 24 hours were applied to GMR stripes with a synthetic PtMn antiferromagnet (AFM) and a permalloy free layer. The temperature dependence of the sensors versus power and pulse width was measured and a simple phenomenological model was developed to analytically determine the stripe temperature. Temperatures of 1260plusmn90degC for melting and 572plusmn66degC for AFM flip were measured. Temperature for the creation of domains was measured at 603plusmn113 and 516plusmn78degC for forward and reverse bias pulses respectfully. Activation energies of 1.2plusmn.2 and 3.0plusmn.3 eV were observed for resistance changes. Irreversible Magnetic degradation exhibited activation energies of 2.4plusmn.3 eV below and 2.7plusmn.3 eV above about 500degC.
Keywords
Permalloy; atomic force microscopy; magnetoresistive devices; manganese alloys; melting; platinum alloys; sensors; temperature measurement; AFM flip; GMR sensor; PtMn; activation energy; electrical overstress; forward bias; magnetic degradation; melting; permalloy free layer; phenomenological model; reverse bias; square wave EOS pulses; synthetic antiferromagnet; thermal characteristics; time 50 ns to 24 h; Antiferromagnetic materials; Earth Observing System; Electrical resistance measurement; Power measurement; Pulse measurements; Sensor phenomena and characterization; Space vector pulse width modulation; Temperature dependence; Temperature sensors; Thermal sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD '06.
Conference_Location
Anaheim, CA
Print_ISBN
978-1-5853-7115-0
Type
conf
Filename
5256789
Link To Document