A new electrical overstress (EOS) test for magnetic recording heads

Author

Wallash, A. ; Zhu, H. ; Torres, R. ; Kraz, V. ; Hughbanks, T.

Author_Institution

Hitachi GST, San Jose, CA, USA

fYear

2006

fDate

10-15 Sept. 2006

Firstpage

131

Lastpage

135

Abstract

Electrical overstress (EOS) damage to magnetic recording heads due to repetitive, sinusoidal, low voltage noise is studied for the first time. A test method is described and used to measure the failure voltage and current for various combinations of signal connections from 200 kHz to 1 GHz. A resonance at 320 MHz, where the current flow increases dramatically and causes severe sensor damage at only 550 mV, was observed. A lumped-element SPICE model is developed and used to extend the experimental measurements. It is concluded that it is important to measure and understand the effect of low voltage, high frequency noise transients on extremely ESD sensitive devices.

Keywords

SPICE; electrostatic discharge; failure analysis; magnetic heads; magnetic recording; EOS test; ESD sensitive devices; electrical overstress; failure voltage measurement; frequency 200 kHz to 1 GHz; frequency 320 MHz; high frequency noise transients; low voltage noise; lumped-element SPICE model; magnetic recording head; voltage 550 mV; Current measurement; Earth Observing System; Low voltage; Magnetic heads; Magnetic noise; Magnetic recording; Magnetic resonance; SPICE; Testing; Voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Overstress/Electrostatic Discharge Symposium, 2006. EOS/ESD '06.

Conference_Location

Anaheim, CA

Print_ISBN

978-1-5853-7115-0

Type

conf

Filename

5256790