DocumentCode
502689
Title
Optimization of input protection diode for high speed applications
Author
Worley, Eugene R. ; Bakulin, Alex
Author_Institution
Conexant Systems, 4311 Jamboree Rd., Newport Beach, CA 92660, USA
fYear
2002
fDate
6-10 Oct. 2002
Firstpage
62
Lastpage
72
Abstract
Optimization of input protection diodes for high-speed applications including RF and Internet receivers is examined. The key parameters used to rate the diodes are the RC time constant and the failure point defined by HBM failure voltage per unit of capacitance. Minimizing the RC time constant for stripe diodes includes looking at tapered metal, wide ground stripes, slot contacts, background doping, and the length of the stripes. Maximizing the failure point includes looking at tapered metal, contacts, and proximity effects.
Keywords
Diodes; Protection;
fLanguage
English
Publisher
ieee
Conference_Titel
2002 Electrical Overstress/Electrostatic Discharge Symposium, 2002. EOS/ESD '02.
Conference_Location
Charlotte, NC, USA
Print_ISBN
978-1-5853-7040-5
Electronic_ISBN
978-1-5853-7040-5
Type
conf
Filename
5267039
Link To Document