Title :
Current detection trigger scheme for SCR based ESD protection of output drivers in CMOS technologies avoiding competitive triggering
Author :
Van Camp, Benjamin ; De Ranter, Frederic ; Keppens, Bart
Author_Institution :
Sarnoff Eur., Gistel, Belgium
Abstract :
A local protection scheme for output drivers is presented, solving the competitive triggering issue using only a very small series (~10 Ohm) resistance. This novel solution uses an SCR that is triggered by current flowing through the driver in ESD mode.
Keywords :
CMOS integrated circuits; driver circuits; electrostatic discharge; thyristors; CMOS technology; SCR based ESD protection; current detection trigger scheme; electrostatic discharge; output driver; silicon-controlled rectifier; CMOS technology; Clamps; Conductivity; Electrostatic discharge; Implants; Low voltage; MOS devices; Protection; Threshold voltage; Thyristors;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2005. EOS/ESD '05.
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-58537-069-6
Electronic_ISBN :
978-1-58537-069-6
