Title :
EOS exposure of magnetic heads and assemblies in automated manufacturing
Author :
Kraz, Vladimir ; Tachamaneekorn, Patsawat ; Napombejara, Dutharuthai
Author_Institution :
Credence Technol. Inc., Soquel, CA, USA
Abstract :
EOS exposure to the magnetic heads in production is often overlooked in favor of ESD. As sensitivity of the heads increases for the magnetic heads, EOS exposure becomes more important and no longer can be ignored. This paper discusses specific examples of EOS exposure such as EMI-induced EOS, voltage-source EOS, transformer coupling-caused EOS and others.
Keywords :
electrostatic discharge; magnetic heads; EMI-induced EOS; EOS exposure; automated manufacturing; electric overstress; magnetic heads; transformer coupling-caused EOS; voltage-source EOS; Assembly; Earth Observing System; Electrostatic discharge; Frequency; Magnetic heads; Manufacturing automation; Preventive maintenance; Production; Surface impedance; Voltage;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2005. EOS/ESD '05.
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-58537-069-6
Electronic_ISBN :
978-1-58537-069-6
