Title :
Problems with IO to all other IOs ESD stress test: Two case studies
Author :
Lin, Yen-Yi ; Marum, Steve ; Duvuury, Charvaka ; Schichl, Joe ; Watson, Ricky
Author_Institution :
Silicon Technol. Dev., Texas Instrum. Inc., Dallas, TX, USA
Abstract :
We report an unusual ESD failure when testing according to the recommended stress combination of IO to all other IO pins. In two independent product cases we observed devices failing for this test while the same devices pass when tested for all possible IO pin to IO pin combinations. These results strongly suggest a revision of this test methodology.
Keywords :
circuit testing; electrostatic discharge; ESD stress test; ESD test failure; IO pin combination; CMOS technology; Electrostatic discharge; FETs; Instruments; Logic testing; MOS devices; Pins; Protection; Stress; Switches;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2005. EOS/ESD '05.
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-58537-069-6
Electronic_ISBN :
978-1-58537-069-6
