Title :
Unifying factory ESD measurements and component ESD stress testing
Author :
Montoya, Julian A. ; Maloney, Timothy J.
Author_Institution :
Intel Corp., Hillsboro, OR, USA
Abstract :
ESD events are detected in the factory using an oscilloscope and a broadband E-field antenna for observing the radiation. These results are correlated to component CDM ESD test data for the first time. We show how the gap was bridged with factory data and laboratory observations of electric dipole radiation, with the peak-to-peak voltage swing (Vp-p) of the antenna signal proven to be a key parameter. We also formulate a circuit model of the standard CDM tester, and clearly show the influence of certain features. Finally, we use both factory and CDM test results in a statistical model for predicting factory ESD fallout in DPM.
Keywords :
broadband antennas; dipole antennas; electrostatic discharge; oscilloscopes; broadband E-field antenna; charged device model; component ESD stress testing; electric dipole radiation; factory ESD fallout prediction; factory ESD measurement; oscilloscope; peak-to-peak voltage swing; standard CDM tester circuit model; statistical model; Antenna measurements; Broadband antennas; Circuit testing; Dipole antennas; Electrostatic discharge; Event detection; Oscilloscopes; Production facilities; Radiation detectors; Stress measurement;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2005. EOS/ESD '05.
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-58537-069-6
Electronic_ISBN :
978-1-58537-069-6