• DocumentCode
    503006
  • Title

    Experience in HBM ESD testing of high pin count devices

  • Author

    Brodbeck, Tilo ; Gaertner, Reinhold

  • Author_Institution
    Infineon Technol. AG, Munich, Germany
  • fYear
    2005
  • fDate
    8-16 Sept. 2005
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    HBM ESD sensitivity testing of high pin count devices is a challenge for current testers and the standardized test procedure. Alternative HBM test procedures are described for the test of devices with fewer tester channels than device pins. Experimental results for the ldquoSplit-IOrdquo test method are presented and the risks of divergent results are discussed.
  • Keywords
    electrostatic discharge; integrated circuit testing; sensitivity analysis; HBM ESD sensitivity testing; high pin count device; microelectronic component; split-IO test method; standardized test procedure; Costs; Electrostatic discharge; IEC standards; Manufacturing; Microelectronics; Military standards; Performance evaluation; Pins; Power supplies; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium, 2005. EOS/ESD '05.
  • Conference_Location
    Tucson, AZ
  • Print_ISBN
    978-1-58537-069-6
  • Electronic_ISBN
    978-1-58537-069-6
  • Type

    conf

  • Filename
    5271763
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=503006