• DocumentCode
    503011
  • Title

    Snapback device studies using multilevel TLP and multi-impedance TLP testers

  • Author

    Grund, Evan

  • Author_Institution
    Oryx Instrum. Corp., Fremont, CA, USA
  • fYear
    2005
  • fDate
    8-16 Sept. 2005
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    Standard 50-ohm TDR TLP systems do not accurately measure the clamp voltage and minimum holding currents of snapback ESD protection structures. Two methods are presented that can accurately determine device operation at the turn-on point. Multilevel TLP generated with charge lines is contrasted with 100-to-1000-ohm TDRT for snapback parameter determination.
  • Keywords
    electric current measurement; electrostatic discharge; integrated circuit testing; transmission lines; voltage measurement; clamp voltage measurement; electrostatic discharge protection; holding current measurement; snapback device; transmission line pulsing; Biological system modeling; Electrostatic discharge; Impedance; Protection; Pulse generation; Reflection; Resistors; System testing; Transmission lines; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium, 2005. EOS/ESD '05.
  • Conference_Location
    Tucson, AZ
  • Print_ISBN
    978-1-58537-069-6
  • Electronic_ISBN
    978-1-58537-069-6
  • Type

    conf

  • Filename
    5271778
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=503011