• DocumentCode
    503036
  • Title

    Standardization of the transmission line pulse (TLP) methodology for electrostatic discharge (ESD)

  • Author

    Voldman, Steven H. ; Ashton, Robert ; Barth, Jon ; Bennett, David ; Bernier, Joseph ; Chaine, Michael ; Daughton, Jeffrey ; Grund, Evan ; Farris, Marti ; Gieser, Horst ; Henry, Leo G. ; Hopkins, Mike ; Hyatt, Hugh ; Natarajan, M.I. ; Juliano, Patrick ; Ma

  • fYear
    2003
  • fDate
    21-25 Sept. 2003
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    Standardization of the methodology of transmission line pulse (TLP) testing has become a necessary reality as it becomes a common place practice in the ESD discipline. This paper discusses the development and method of a TLP standard practice.
  • Keywords
    electrostatic discharge; semiconductor device testing; transmission lines; ESD; electrostatic discharge; semiconductor device; transmission line pulse testing; Circuit testing; Design engineering; EMP radiation effects; Electronic equipment testing; Electronics industry; Electrostatic discharge; Reliability engineering; Semiconductor device testing; Standardization; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium, 2003. EOS/ESD '03.
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    978-1-5853-7057-3
  • Electronic_ISBN
    978-1-5853-7057-3
  • Type

    conf

  • Filename
    5271999
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=503036