Title :
Capacitively coupled transmission line pulsing CC-TLP – A traceable and reproducible stress method in the CDM-domain
Author :
Wolf, Heinrich ; Gieser, Horst ; Stadler, Wolfgang ; Wilkening, Wolfgang
Author_Institution :
IZM-M/ATIS Anal. & Test of Integrated Syst., Fraunhofer-Inst. fur Zuverlassigkeit und Mikrointegration, Munich, Germany
Abstract :
This paper describes a new test method called Capacitively Coupled Transmission Line Pulsing cc-TLP. It is applied to different test circuits which were mounted on specially designed package emulators with a defined background capacitance. The test results are compared with the ESD thresholds obtained by CDM tests. The CC-TLP results correlate well with the CDM data.
Keywords :
electrostatic discharge; stress analysis; transmission lines; CDM test; ESD threshold; background capacitance; capacitively coupled transmission line pulsing; package emulator; stress method; test circuit; Capacitance; Circuit testing; Coupling circuits; Distributed parameter circuits; Electrostatic discharge; Impedance; Packaging; Relays; Stress; Transmission lines;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2003. EOS/ESD '03.
Conference_Location :
Las Vegas, NB
Print_ISBN :
978-1-5853-7057-3
Electronic_ISBN :
978-1-5853-7057-3
