Combined TLP/RF testing system for detection of ESD failures in RF circuits

Author

Hyvonen, Sami ; Joshi, Sopan ; Rosenbaum, Elyse

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, TX, USA

fYear

2003

fDate

21-25 Sept. 2003

Firstpage

1

Lastpage

8

Abstract

We present a modified TLP measurement system in which full functional RF testing, along with conventional leakage current measurement, is performed after each pulse to detect failure. Measurement results from 5-GHz LNAs show that RF metrics degrade before the leakage current increases. Also, we introduce an ESD-protected RF circuit for which leakage current measurements cannot be made, necessitating the use of other failure criteria.

Keywords

electric current measurement; electrostatic discharge; leakage currents; low noise amplifiers; microwave amplifiers; radiofrequency integrated circuits; transmission lines; ESD failure detection; LNA; combined TLP/RF testing system; frequency 5 GHz; leakage current measurement; microwave amplifer; radiofrequency circuits; Circuit testing; Current measurement; Degradation; Electrostatic discharge; Leak detection; Leakage current; Performance evaluation; Pulse measurements; Radio frequency; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Overstress/Electrostatic Discharge Symposium, 2003. EOS/ESD '03.

Conference_Location

Las Vegas, NB

Print_ISBN

978-1-5853-7057-3

Electronic_ISBN

978-1-5853-7057-3

Type

conf

Filename

5272004