DocumentCode :
503090
Title :
3D IC products using TSV for mobile phone applications: An industrial perpective
Author :
Guillou, Yann ; Dutron, Anne-Marie
Author_Institution :
ST-ERICSSON, Grenoble, France
fYear :
2009
fDate :
15-18 June 2009
Firstpage :
1
Lastpage :
6
Abstract :
3D integration and configurations based on More than Moore approaches are becoming very popular in recent years. The first applications that could use this breakthrough technology are making more and more sense for implementation in the next generations of cellular phones. This paper gives explanations on what is 3D Integration and divides this denomination into 2 main categories: 3D at the packaging level and 3D at the IC level. Presentations of R&D efforts in both categories are given in order to illustrate the main differences. Insights about the complementarities of 3D ICs with some latest advanced packaging solutions such as Fan-Out Wafer Level Packaging are discussed. Finally, a global roadmap of applications that may use these advanced solutions is shown with respective challenges and timeframes.
Keywords :
integrated circuit manufacture; mobile handsets; printed circuit manufacture; research and development; wafer level packaging; 3D integrated circuits; fan-out wafer level packaging; packaging level; research and development; through silicon vias; Mobile handsets; Three-dimensional integrated circuits; Through-silicon vias; 3D integration; Cellular phones; Fan-Out Wafer Level Packaging (FOWLP); Through Silicon Via (TSV);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics and Packaging Conference, 2009. EMPC 2009. European
Conference_Location :
Rimini
Print_ISBN :
978-1-4244-4722-0
Electronic_ISBN :
978-0-6152-9868-9
Type :
conf
Filename :
5272851
Link To Document :
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