Title :
Size and microstructure effects on the stress-strain behaviour of lead-free solder joints
Author :
Hegde, Pradeep ; Whalley, David C. ; Silberschmidt, Vadim V.
Author_Institution :
Wolfson Sch. of Mech. & Manuf. Eng., Loughborough Univ., Loughborough, UK
Abstract :
The properties of lead-free solders such as Sn3.8Ag0.7Cu are less understood than traditional Sn-Pb solders, as well as the factors affecting these material properties. Therefore, the present paper focuses on determination of stress-strain properties for both small-scale solder joints and for bulk solder for three different strain rates. The paper also analyses the obtained experimental results, and compares material properties between the solder joint and the bulk solder. The reasons for the differences in the observed material properties are discussed, and their effects are separated through the use of finite-element analysis.
Keywords :
copper alloys; finite element analysis; lead alloys; silver alloys; solders; stress-strain relations; tin alloys; SnAgCu; SnPb; bulk solder; finite-element analysis; microstructure effects; solder joints; stress-strain behaviour; Electronic packaging thermal management; Environmentally friendly manufacturing techniques; Fabrication; Finite element methods; Joining materials; Lead; Material properties; Microstructure; Soldering; Thermal expansion; Lead-free; Sn3.8Ag0.7Cu; Stress-strain; size effect and microstructure effect;
Conference_Titel :
Microelectronics and Packaging Conference, 2009. EMPC 2009. European
Conference_Location :
Rimini
Print_ISBN :
978-1-4244-4722-0
Electronic_ISBN :
978-0-6152-9868-9