• DocumentCode
    503368
  • Title

    Resonator measurements of superonductor surface impedance provided oscillations degeneration removal

  • Author

    Barannik, Alexander A. ; Glamazdin, V.V. ; Skresanov, V.N. ; Cherpak, N.T.

  • Author_Institution
    A. Usikov Inst. of Radio Phys. & Electron., Nat. Acad. of Sci. of Ukraine, Kharkiv, Ukraine
  • fYear
    2009
  • fDate
    14-18 Sept. 2009
  • Firstpage
    797
  • Lastpage
    798
  • Abstract
    The processing technique of amplitude-frequency response (AFR) of resonators with partial removal of mode of degeneration was developed, which allows calculating of resonance frequency and quality-factor. The approach was used for data processing obtained at AFR measurement of sapphire resonator with HTS film as a key stage of determination of surface impedance.
  • Keywords
    electric impedance measurement; frequency response; high-temperature superconductors; oscillations; sapphire; superconducting resonators; superconducting thin films; surface impedance; AFR measurement; Al2O3; HTS film; amplitude-frequency response; data processing; oscillation degeneration removal; resonance frequency; resonator measurement; sapphire resonator; superconductor surface impedance; Helium; IEEE catalog; Impedance measurement; Indium tin oxide; Organizing; Surface impedance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave & Telecommunication Technology, 2009. CriMiCo 2009. 19th International Crimean Conference
  • Conference_Location
    Sevastopol
  • Print_ISBN
    978-1-4244-4796-1
  • Type

    conf

  • Filename
    5292864
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=503368