• DocumentCode
    503399
  • Title

    Radiation effects in bipolar transistors baised on silicon - germanium heterostructures

  • Author

    Gromov, D.V. ; Elesin, Vadim V. ; Chukov, George V. ; Repin, V.V.

  • fYear
    2009
  • fDate
    14-18 Sept. 2009
  • Firstpage
    726
  • Lastpage
    727
  • Abstract
    Ionizing radiation effects upon the properties of bipolar transistors on silicon-germanium heterostructures are investigated.
  • Keywords
    Ge-Si alloys; heterojunction bipolar transistors; radiation hardening (electronics); Si-Ge; bipolar transistor; ionizing radiation effect; silicon-germanium heterostructure; Bipolar transistors; Germanium silicon alloys; Helium; IEEE catalog; Indium tin oxide; Microwave communication; Organizing; Radiation effects; Silicon germanium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave & Telecommunication Technology, 2009. CriMiCo 2009. 19th International Crimean Conference
  • Conference_Location
    Sevastopol
  • Print_ISBN
    978-1-4244-4796-1
  • Type

    conf

  • Filename
    5292902