Title :
Test and measurement system for microwave semiconductor devices and IC investigation on radiation hardness
Author :
Gromov, D.V. ; Polevich, S.A. ; Elesin, V.V.
Author_Institution :
Specialized Electron. Syst., Moscow, Russia
Abstract :
Test and measurement system for microwave semiconductor devices and IC´s investigation on radiation hardness has been presented and described.
Keywords :
MMIC; radiation hardening (electronics); IC investigation; measurement system; microwave semiconductor devices; radiation hardness; test system; Automatic testing; Helium; Integrated circuit testing; Microwave devices; Microwave integrated circuits; Microwave measurements; Semiconductor device measurement; Semiconductor device testing; Semiconductor devices; System testing;
Conference_Titel :
Microwave & Telecommunication Technology, 2009. CriMiCo 2009. 19th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4244-4796-1
