• DocumentCode
    503401
  • Title

    Test and measurement system for microwave semiconductor devices and IC investigation on radiation hardness

  • Author

    Gromov, D.V. ; Polevich, S.A. ; Elesin, V.V.

  • Author_Institution
    Specialized Electron. Syst., Moscow, Russia
  • fYear
    2009
  • fDate
    14-18 Sept. 2009
  • Firstpage
    730
  • Lastpage
    731
  • Abstract
    Test and measurement system for microwave semiconductor devices and IC´s investigation on radiation hardness has been presented and described.
  • Keywords
    MMIC; radiation hardening (electronics); IC investigation; measurement system; microwave semiconductor devices; radiation hardness; test system; Automatic testing; Helium; Integrated circuit testing; Microwave devices; Microwave integrated circuits; Microwave measurements; Semiconductor device measurement; Semiconductor device testing; Semiconductor devices; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave & Telecommunication Technology, 2009. CriMiCo 2009. 19th International Crimean Conference
  • Conference_Location
    Sevastopol
  • Print_ISBN
    978-1-4244-4796-1
  • Type

    conf

  • Filename
    5292904
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=503401