Title :
Forecasting ic stability at the effect of power pulse electromagnetic field
Author :
Glumova, M.V. ; Gribskij, M.P. ; Grigorev, E.V. ; Starostenko, V.V. ; Taran, E.P. ; Unzhakov, D.A.
Author_Institution :
Taurida Nat. Univ. V. I. Vernadsky, Simferopol, Ukraine
Abstract :
The results of predictive modeling of resistability of modern microcircuits at influence of powerful pulse electromagnetic fields on the basis of experimental data and numerically-analytical model are discussed.
Keywords :
electromagnetic fields; field effect integrated circuits; IC stability forecasting; microcircuits; power pulse electromagnetic field; predictive modeling; Circuits; EMP radiation effects; Electromagnetic fields; Helium; Indium tin oxide; RNA; Stability;
Conference_Titel :
Microwave & Telecommunication Technology, 2009. CriMiCo 2009. 19th International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4244-4796-1
