DocumentCode
503482
Title
Scanners for near-field microwave microscopy
Author
Derkach, V.N. ; Golovashchenko, R.V. ; Goroshko, O.V. ; Korzh, V.G. ; Anbinderis, T. ; Laurinavicius, A.
Author_Institution
Usikov Inst. of Radiophys. & Electron., NAS of Ukraine, Kharkov, Ukraine
fYear
2009
fDate
14-18 Sept. 2009
Firstpage
559
Lastpage
560
Abstract
The description of methods and facilities of microwave near-field microscopy and the radiophysical equipment designed within the framework of scientific and technical cooperation is given. The results of model experiments, amplitude and phase pictures of optically opaque objects by using the near-field technique are considered at frequencies of (40...140) GHz.
Keywords
microwave measurement; scanning probe microscopy; amplitude pictures; frequency 40 GHz to 140 GHz; microwave microscopy; near-field microwave microscopy; optically opaque objects; phase pictures; radiophysical equipment design; scanners; Diffraction gratings; Helium; IEEE catalog; Microscopy; Organizing; Physics;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave & Telecommunication Technology, 2009. CriMiCo 2009. 19th International Crimean Conference
Conference_Location
Sevastopol
Print_ISBN
978-1-4244-4796-1
Type
conf
Filename
5293001
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