Title :
A high-isolation high-linearity 24-GHz CMOS T/R switch in the 0.18-µm CMOS process
Author :
Ou, C.-Y. ; Hsu, C.Y. ; Lin, H.-R. ; Chuang, H.-R.
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
A 24-GHz single-pole double-throw (SPDT) transmit/receive switch fabricated in the 0.18-mum CMOS process is presented. The T/R switch is designed to improve the isolation and power handling capability by shunt inductor resonance and body-floating techniques. On-wafer measurement of the switch is performed. The 24-GHz switch exhibits the return losses at all ports of higher than 14 dB, insertion loss of 6 dB, isolation between transmitter and receiver of 32.2 dB, input 1-dB compression point (P1dB) of 21.5 dBm, and input third-order intercept point (IIP3) of 32.6 dBm. This is a successful demonstration of high isolation and high power handling capability CMOS T/R switch at 24 GHz.
Keywords :
CMOS integrated circuits; isolation technology; microwave switches; transceivers; CMOS process; body-floating techniques; frequency 24 GHz; high-isolation high-linearity CMOS T-R switch; input third-order intercept point; on-wafer measurement; power handling capability; shunt inductor resonance; single-pole double-throw transmit-receive switch; size 0.18 mum; CMOS process; CMOS technology; Communication switching; Frequency; Inductors; Linearity; Millimeter wave technology; Shunt (electrical); Switches; Switching circuits;
Conference_Titel :
Microwave Integrated Circuits Conference, 2009. EuMIC 2009. European
Conference_Location :
Rome
Print_ISBN :
978-1-4244-4749-7