SNOM measurements on metalic nanostructures

Author

Kusko, C. ; Dinescu, A. ; Rebigan, R. ; Kusko, M. ; Cristea, D.

Author_Institution

IMT-Bucharest, Bucharest, Romania

Volume

1

fYear

2009

fDate

12-14 Oct. 2009

Firstpage

197

Lastpage

200

Abstract

We present transmission and reflection near field scanning optical microscopy (SNOM) images on a metallic nanostructure realized by a combination of electron beam lithography (EBL) patterning and liftoff procedure. The structure consists in a square lattice of gold disks of 80 nm height with the diameter of 200 nm and the lattice constant of 400 nm. FDTD simulations were used in order to understand the interaction of the optical near field with the nanostructure and to interpret the SNOM reflection images.

Keywords

electron beam lithography; finite difference time-domain analysis; gold; nanofabrication; nanolithography; nanostructured materials; near-field scanning optical microscopy; plasmonics; Au; EBL patterning; FDTD simulations; SNOM image reflection; electron beam lithography; lattice constant; liftoff process; metallic nanostructure; reflection near field scanning optical microscopy; size 200 nm; size 80 nm; transmission near field scanning optical microscopy; Electron beams; Electron optics; Gold; Lattices; Lithography; Nanostructures; Optical microscopy; Optical reflection; Scanning electron microscopy; Transmission electron microscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Semiconductor Conference, 2009. CAS 2009. International

Conference_Location

Sinaia

ISSN

1545-827X

Print_ISBN

978-1-4244-4413-7

Type

conf

DOI

10.1109/SMICND.2009.5336574

Filename

5336574