DocumentCode
505421
Title
Thick THB sacrificial layer and metal encapsulation process
Author
Vahabisani, Nahid ; Daneshmand, Mojgan
Author_Institution
Electrical and Computer Engineering Department, University of Alberta, Edmonton, Canada
fYear
2009
fDate
13-14 Oct. 2009
Firstpage
144
Lastpage
147
Abstract
Here, THB as a sacrificial layer has been characterized and used to develop a metal encapsulating process. The idea in combination with conventional thin film processes is vey helpful for thick monolithic wafer-level packaging of RF MEMS devices allowing a vertical space of as large as 100 µm for the devices to freely actuate. In this method, a very thick layer of THB 151N photo resist (100µm) in combination of thin films (1 µm–5 µm) is employed to serve as encapsulation. This thick layer is removed at the end of the process leaving a very spacious cavity. The proposed technique helps in advancing monolithic packaging field and increasing the thickness considerably.
fLanguage
English
Publisher
iet
Conference_Titel
Microsystems and Nanoelectronics Research Conference, 2009. MNRC 2009. 2nd
Conference_Location
Ottawa, ON, Canada
Print_ISBN
978-1-4244-4751-0
Type
conf
Filename
5338940
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