DocumentCode :
505421
Title :
Thick THB sacrificial layer and metal encapsulation process
Author :
Vahabisani, Nahid ; Daneshmand, Mojgan
Author_Institution :
Electrical and Computer Engineering Department, University of Alberta, Edmonton, Canada
fYear :
2009
fDate :
13-14 Oct. 2009
Firstpage :
144
Lastpage :
147
Abstract :
Here, THB as a sacrificial layer has been characterized and used to develop a metal encapsulating process. The idea in combination with conventional thin film processes is vey helpful for thick monolithic wafer-level packaging of RF MEMS devices allowing a vertical space of as large as 100 µm for the devices to freely actuate. In this method, a very thick layer of THB 151N photo resist (100µm) in combination of thin films (1 µm–5 µm) is employed to serve as encapsulation. This thick layer is removed at the end of the process leaving a very spacious cavity. The proposed technique helps in advancing monolithic packaging field and increasing the thickness considerably.
fLanguage :
English
Publisher :
iet
Conference_Titel :
Microsystems and Nanoelectronics Research Conference, 2009. MNRC 2009. 2nd
Conference_Location :
Ottawa, ON, Canada
Print_ISBN :
978-1-4244-4751-0
Type :
conf
Filename :
5338940
Link To Document :
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