• DocumentCode
    505421
  • Title

    Thick THB sacrificial layer and metal encapsulation process

  • Author

    Vahabisani, Nahid ; Daneshmand, Mojgan

  • Author_Institution
    Electrical and Computer Engineering Department, University of Alberta, Edmonton, Canada
  • fYear
    2009
  • fDate
    13-14 Oct. 2009
  • Firstpage
    144
  • Lastpage
    147
  • Abstract
    Here, THB as a sacrificial layer has been characterized and used to develop a metal encapsulating process. The idea in combination with conventional thin film processes is vey helpful for thick monolithic wafer-level packaging of RF MEMS devices allowing a vertical space of as large as 100 µm for the devices to freely actuate. In this method, a very thick layer of THB 151N photo resist (100µm) in combination of thin films (1 µm–5 µm) is employed to serve as encapsulation. This thick layer is removed at the end of the process leaving a very spacious cavity. The proposed technique helps in advancing monolithic packaging field and increasing the thickness considerably.
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Microsystems and Nanoelectronics Research Conference, 2009. MNRC 2009. 2nd
  • Conference_Location
    Ottawa, ON, Canada
  • Print_ISBN
    978-1-4244-4751-0
  • Type

    conf

  • Filename
    5338940