DocumentCode
505473
Title
Numerical simulation of complex submicron devices with experimentally determined power maps
Author
Raad, Peter E. ; Burzo, Mihai G. ; Komarov, Pavel L.
Author_Institution
IEEE Conference Publishing, Southern Methodist Univ., Plano, TX, USA
fYear
2009
fDate
7-9 Oct. 2009
Firstpage
36
Lastpage
39
Abstract
Both computational and experimental methods play a key role in thermal characterization, particularly in prototyping and design with each having their own set of strengths and weakness. In this work the authors demonstrate that simulation methods can provide temperature information in three spatial dimensions and in critical regions that are inaccessible to measurement tools. Combining the complementary tools of experimentation and simulation can leverage their respective strengths and create a coupled approach that is vastly more powerful than either tool alone.
Keywords
integrated circuit modelling; integrated circuit packaging; thermal management (packaging); complex submicron device simulation; microelectronic devices; power maps; thermal characterization; Computational modeling; Electronics cooling; Impedance; Moore´s Law; Numerical simulation; Power distribution; Prototypes; Publishing; Spatial resolution; Temperature distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal Investigations of ICs and Systems, 2009. THERMINIC 2009. 15th International Workshop on
Conference_Location
Leuven
Print_ISBN
978-1-4244-5881-3
Type
conf
Filename
5340049
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