• DocumentCode
    505473
  • Title

    Numerical simulation of complex submicron devices with experimentally determined power maps

  • Author

    Raad, Peter E. ; Burzo, Mihai G. ; Komarov, Pavel L.

  • Author_Institution
    IEEE Conference Publishing, Southern Methodist Univ., Plano, TX, USA
  • fYear
    2009
  • fDate
    7-9 Oct. 2009
  • Firstpage
    36
  • Lastpage
    39
  • Abstract
    Both computational and experimental methods play a key role in thermal characterization, particularly in prototyping and design with each having their own set of strengths and weakness. In this work the authors demonstrate that simulation methods can provide temperature information in three spatial dimensions and in critical regions that are inaccessible to measurement tools. Combining the complementary tools of experimentation and simulation can leverage their respective strengths and create a coupled approach that is vastly more powerful than either tool alone.
  • Keywords
    integrated circuit modelling; integrated circuit packaging; thermal management (packaging); complex submicron device simulation; microelectronic devices; power maps; thermal characterization; Computational modeling; Electronics cooling; Impedance; Moore´s Law; Numerical simulation; Power distribution; Prototypes; Publishing; Spatial resolution; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal Investigations of ICs and Systems, 2009. THERMINIC 2009. 15th International Workshop on
  • Conference_Location
    Leuven
  • Print_ISBN
    978-1-4244-5881-3
  • Type

    conf

  • Filename
    5340049