• DocumentCode
    505479
  • Title

    Thermal issues of solar irradiation sensor

  • Author

    Plesz, B. ; Földváry, Á ; Bándy, E.

  • Author_Institution
    Dept. of Electron Devices, Budapest Univ. of Technol. & Econ., Budapest, Hungary
  • fYear
    2009
  • fDate
    7-9 Oct. 2009
  • Firstpage
    61
  • Lastpage
    65
  • Abstract
    Nowadays the importance of solar cells and R&D in this field is steadily increasing. The most important parameter of a solar cell is the generated power, which can be enhanced by use of solar tracking. For a correct determination of the tracking system´s efficiency an irradiation sensor is necessary, because the irradiation from the sun changes constantly. This sensor device is placed on the tracker´s frame and transfers the intensity data to a monitoring system. The sensor developed for irradiation measurement must have accuracy and a reliable construction under outdoor use conditions (between the temperature values of -20degC and 80degC). The sensor is based on a photoelectric cell, and incorporates a read out circuit for providing steady short circuit conditions for the cell as well as for signal amplification. Thermal tests (HTS, LTOL) were accomplished in a climate chamber in the temperature range of -20 to 80degC in steps of 10degC. To determine the fundamentals of the thermal dependence of the sensor cell spectral response measurements under varying temperatures were performed.
  • Keywords
    photodetectors; photoelectric cells; HTS test; LTOL test; high temperature store test; irradiation measurement; low temperature operating life test; photoelectric cell; read out circuit; short circuit conditions; signal amplification; solar cell; solar irradiation sensor; solar tracking; spectral response; temperature -20 degC to 80 degC; thermal test; Circuit testing; High temperature superconductors; Photovoltaic cells; Power generation; Sensor systems; Solar power generation; Sun; Temperature measurement; Temperature sensors; Thermal sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal Investigations of ICs and Systems, 2009. THERMINIC 2009. 15th International Workshop on
  • Conference_Location
    Leuven
  • Print_ISBN
    978-1-4244-5881-3
  • Type

    conf

  • Filename
    5340055