Title :
Using VFTLP data to design for CDM robustness
Author :
Chu, Charles ; Gallerano, Antonio ; Watt, Jeff ; Hoang, Tim ; Tran, Tina ; Chan, Doris ; Wong, Wilson ; Barth, Jon ; Johnson, Martin
Author_Institution :
Altera Corp., San Jose, CA, USA
fDate :
Aug. 30 2009-Sept. 4 2009
Abstract :
In this paper, transient behavior of DTSCRs is captured and analyzed using high speed measurement with VFTLP. It is possible to use this data to properly design for CDM performance of final product while maximizing performance.
Keywords :
diodes; electrostatic discharge; failure analysis; high-speed techniques; thyristors; transients; transmission lines; CDM robustness; DTSCRs; Si; VFTLP data; diode triggered SCR; failure analysis; high-speed measurement; maximizing performance; silicon controlled rectifier; transient behavior; very-fast transmission line pulse; Circuit testing; Clamps; Electrostatic discharge; Fault location; Oscilloscopes; Packaging; Protection; Robustness; Vehicles; Voltage;
Conference_Titel :
EOS/ESD Symposium, 2009 31st
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-58537-176-1
Electronic_ISBN :
978-1-58537-176-1
