Title :
FCDM measurements of small devices
Author :
Johnson, M. ; Ashton, R. ; Ward, S.
Author_Institution :
Nat. Semicond. Corp, Santa Clara, CA, USA
fDate :
Aug. 30 2009-Sept. 4 2009
Abstract :
Peak current measurements using high bandwidth oscilloscopes show that even small packages exhibit high amplitude FCDM currents. The effects of support templates and vacuum holes on the measured FCDM current waveform are discussed and analyzed, along with other challenges of FCDM stressing small footprint devices.
Keywords :
electrostatic devices; oscilloscopes; FCDM current waveform; FCDM measurements; field induced charged device model; high bandwidth oscilloscopes; peak current measurements; small footprint devices; support templates; vacuum holes; Bandwidth; Circuit testing; Current measurement; Electrostatic discharge; Instruments; Oscilloscopes; Packaging; Semiconductor device testing; Stress measurement; System testing;
Conference_Titel :
EOS/ESD Symposium, 2009 31st
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-58537-176-1
Electronic_ISBN :
978-1-58537-176-1
