• DocumentCode
    505544
  • Title

    The application of large-signal calibration techniques yields unprecedented insight during TLP and ESD testing

  • Author

    Gillon, Renaud ; Vanden Bossche, Marc ; Verbeyst, Frans

  • Author_Institution
    ON Semicond. Belgium BVBA, Oudenaarde, Belgium
  • fYear
    2009
  • fDate
    Aug. 30 2009-Sept. 4 2009
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    This paper presents the application of a rigorous large-signal AC calibration technique to TLP waveforms. In contrast to standard practice, which discards information `hidden´ in the transients, the new method allows to visualize currents and voltages occurring at the device-under-test without the distortions which render standard TLP waveforms difficult to interpret.
  • Keywords
    calibration; electrostatic discharge; transistors; ESD testing; TLP testing; TLP waveforms; large-signal AC calibration technique; transistors; transmission-line pulse technique; Calibration; Electronic mail; Electrostatic discharge; Energy measurement; Equations; Frequency measurement; Radio frequency; Scattering parameters; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    EOS/ESD Symposium, 2009 31st
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    978-1-58537-176-1
  • Electronic_ISBN
    978-1-58537-176-1
  • Type

    conf

  • Filename
    5340131