DocumentCode
505544
Title
The application of large-signal calibration techniques yields unprecedented insight during TLP and ESD testing
Author
Gillon, Renaud ; Vanden Bossche, Marc ; Verbeyst, Frans
Author_Institution
ON Semicond. Belgium BVBA, Oudenaarde, Belgium
fYear
2009
fDate
Aug. 30 2009-Sept. 4 2009
Firstpage
1
Lastpage
7
Abstract
This paper presents the application of a rigorous large-signal AC calibration technique to TLP waveforms. In contrast to standard practice, which discards information `hidden´ in the transients, the new method allows to visualize currents and voltages occurring at the device-under-test without the distortions which render standard TLP waveforms difficult to interpret.
Keywords
calibration; electrostatic discharge; transistors; ESD testing; TLP testing; TLP waveforms; large-signal AC calibration technique; transistors; transmission-line pulse technique; Calibration; Electronic mail; Electrostatic discharge; Energy measurement; Equations; Frequency measurement; Radio frequency; Scattering parameters; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
EOS/ESD Symposium, 2009 31st
Conference_Location
Anaheim, CA
Print_ISBN
978-1-58537-176-1
Electronic_ISBN
978-1-58537-176-1
Type
conf
Filename
5340131
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