DocumentCode :
505544
Title :
The application of large-signal calibration techniques yields unprecedented insight during TLP and ESD testing
Author :
Gillon, Renaud ; Vanden Bossche, Marc ; Verbeyst, Frans
Author_Institution :
ON Semicond. Belgium BVBA, Oudenaarde, Belgium
fYear :
2009
fDate :
Aug. 30 2009-Sept. 4 2009
Firstpage :
1
Lastpage :
7
Abstract :
This paper presents the application of a rigorous large-signal AC calibration technique to TLP waveforms. In contrast to standard practice, which discards information `hidden´ in the transients, the new method allows to visualize currents and voltages occurring at the device-under-test without the distortions which render standard TLP waveforms difficult to interpret.
Keywords :
calibration; electrostatic discharge; transistors; ESD testing; TLP testing; TLP waveforms; large-signal AC calibration technique; transistors; transmission-line pulse technique; Calibration; Electronic mail; Electrostatic discharge; Energy measurement; Equations; Frequency measurement; Radio frequency; Scattering parameters; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
EOS/ESD Symposium, 2009 31st
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-58537-176-1
Electronic_ISBN :
978-1-58537-176-1
Type :
conf
Filename :
5340131
Link To Document :
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