• DocumentCode
    505552
  • Title

    CDM protection design for CMOS applications using RC-triggered rail clamps

  • Author

    Stockinger, Michael ; Ruth, Scott ; Miller, James ; Nguyen, Ky ; Akrout, Yassine ; Kearney, Mark ; Drew, Byron ; Ngo, Sean

  • Author_Institution
    Freescale Semicond., Austin, TX, USA
  • fYear
    2009
  • fDate
    Aug. 30 2009-Sept. 4 2009
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    A new ESD protection design method is introduced that optimizes the CDM circuit response of an RC-triggered rail clamp network for I/O protection. The design is verified by VF-TLP and CDM test data of I/O test rings with two different output driver options.
  • Keywords
    CMOS integrated circuits; electrostatic discharge; integrated circuit testing; CDM protection design; CMOS technology; ESD protection design; I-O transistors; RC-triggered rail clamp network; charged device model; circuit response; Clamps; Protection; Rails;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    EOS/ESD Symposium, 2009 31st
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    978-1-58537-176-1
  • Electronic_ISBN
    978-1-58537-176-1
  • Type

    conf

  • Filename
    5340139
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=505552