Title :
CDM protection design for CMOS applications using RC-triggered rail clamps
Author :
Stockinger, Michael ; Ruth, Scott ; Miller, James ; Nguyen, Ky ; Akrout, Yassine ; Kearney, Mark ; Drew, Byron ; Ngo, Sean
Author_Institution :
Freescale Semicond., Austin, TX, USA
fDate :
Aug. 30 2009-Sept. 4 2009
Abstract :
A new ESD protection design method is introduced that optimizes the CDM circuit response of an RC-triggered rail clamp network for I/O protection. The design is verified by VF-TLP and CDM test data of I/O test rings with two different output driver options.
Keywords :
CMOS integrated circuits; electrostatic discharge; integrated circuit testing; CDM protection design; CMOS technology; ESD protection design; I-O transistors; RC-triggered rail clamp network; charged device model; circuit response; Clamps; Protection; Rails;
Conference_Titel :
EOS/ESD Symposium, 2009 31st
Conference_Location :
Anaheim, CA
Print_ISBN :
978-1-58537-176-1
Electronic_ISBN :
978-1-58537-176-1
