• DocumentCode
    505913
  • Title

    The electrical stabilities of flexible ITO thin films on buffer layer coated PET

  • Author

    Zhi-nong, Yu ; Fan, Xia ; Yu-qiong, Li ; Wei, Xue

  • Author_Institution
    Dept. of Opt. Eng., Beijing Inst. of Technol., Beijing, China
  • fYear
    2008
  • fDate
    Oct. 30 2008-Nov. 2 2008
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The electrical stabilities of flexible ITO thin films on buffer layer coated PET were investigated. The results show that TiO2 buffer layer can enhance the electrical stability of ITO films against bending stress effectively most.
  • Keywords
    bending strength; buffer layers; electrical conductivity; indium compounds; ion beam assisted deposition; polymers; semiconductor growth; semiconductor materials; semiconductor thin films; ITO-TiO2; bending stress; buffer layer coated PET; electrical conductivity; electrical stabilities; ion beam assisted deposition; thin films; Buffer layers; Conductive films; Geometry; Indium tin oxide; Positron emission tomography; Stability; Substrates; Temperature; Thermal stresses; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical Fiber Communication & Optoelectronic Exposition & Conference, 2008. AOE 2008. Asia
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-55752-863-6
  • Electronic_ISBN
    978-1-55752-863-6
  • Type

    conf

  • Filename
    5348741
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=505913