Title :
Improved multilayered structure with appropriate interface termination to enhance the imaging resolution in the infrared and optical canalization regime
Author :
Li, Xuan ; Jin, Yi
Author_Institution :
Div. of Electromagn. Eng., R. Inst. of Technol., Stockholm, Sweden
fDate :
Oct. 30 2008-Nov. 2 2008
Abstract :
Improved structure and appropriate surface termination are utilized to enhance dramatically the subwavelength imaging resolution of a multilayered positive-negative permittivity structure with real material loss and operating in the infrared or optical canalization regime.
Keywords :
image resolution; infrared imaging; optical focusing; optical multilayers; permittivity; infrared canalization; interface termination; material loss; multilayered positive-negative permittivity structure; optical canalization; subwavelength focusing; subwavelength imaging resolution; surface termination; Appropriate technology; Dispersion; Focusing; Image resolution; Impedance; Infrared imaging; Irrigation; Optical imaging; Optical surface waves; Permittivity;
Conference_Titel :
Optical Fiber Communication & Optoelectronic Exposition & Conference, 2008. AOE 2008. Asia
Conference_Location :
Shanghai
Print_ISBN :
978-1-55752-863-6
Electronic_ISBN :
978-1-55752-863-6
