• DocumentCode
    506174
  • Title

    How a SIMD machine can implement a complex cellular automata? a case study: von Neumann´s 29-state cellular automaton

  • Author

    Signorini, Jacqueline

  • Author_Institution
    Département d´´Informatique, Université Paris-8, 2, Rue de la Liberté 93526 Saint-Denis - France
  • fYear
    1989
  • fDate
    12-17 Nov. 1989
  • Firstpage
    175
  • Lastpage
    186
  • Abstract
    This study is a part of an effort to simulate the 29-state self-reproducing cellular automaton described by John von Neumann in a manuscript that dates back to 1952. We are interested in the programming of very large SIMD arrays which, as a consequence of scaling them up, incorporate some features of cellular automata. Designing tools for programming them requires an experimental ground: considering that von Neumann´s 29-state is the only known very large and complex cellular automaton, its simulation is a necessary first step. Embedded in a two-dimensional cellular array, using 29 states per cell and 5-cell neighborhood, this automaton exhibits the capabilities of universal computation and universal construction. This paper concentrates on the transition rule that governs the complex behavior of the 29-state automaton. We give a detailed presentation of its transition rule, with illustrative examples to ease its comprehension. We then discuss its implementation on a SIMD machine, using only 13 bits per processing element to encode the rule, each processing element corresponding to a cell. Finally, we present experimental results based upon the simulation of general-purpose components of the automaton: pulser, decoder, periodic pulser on the SIMD machine.
  • Keywords
    Automata; Automatic control; Automatic programming; Computational modeling; Embedded computing; Helium; Kinematics; Mathematical model; National electric code; Turing machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Supercomputing, 1989. Supercomputing '89. Proceedings of the 1989 ACM/IEEE Conference on
  • Conference_Location
    Reno, NV, United States
  • Print_ISBN
    0-89791-341-8
  • Type

    conf

  • DOI
    10.1145/76263.76282
  • Filename
    5349009