Title :
The study on real-time data processing based on CCD scanning and detecting device on FPGA
Author_Institution :
Inf. & Control Eng. Coll., Weifang Univ., Weifang, China
Abstract :
To solve the crossing-linkable polyethylene (XLPE) insulation compound purity evaluation problem, a high speed scanning measurement system was designed according to FPGA. With the updated information technology and advanced electronic devices, it is possible to develop a new inspecting technology for sorting, checking and evaluating material quality, by which defects microscopic images can be real-time recorded, processed and displayed. The experimental results demonstrated that defects within 70 ¿m~1000 ¿m were inspected effectively by the CCD scanning defects inspection instrument, and Good agreement was shown between defects images real-time reconstructed and optical microscopic images not only in shape but also in gray.
Keywords :
CCD image sensors; field programmable gate arrays; image reconstruction; power cable insulation; CCD detecting device; CCD scanning defects inspection instrument; CCD scanning device; FPGA; crossing-linkable polyethylene insulation compound purity evaluation; defects microscopic images; electronic devices; high speed scanning measurement system; image reconstruction; information technology; optical microscopic images; real-time data processing; size 70 mum to 1000 mum; Charge coupled devices; Data processing; Field programmable gate arrays; Information technology; Insulation; Optical materials; Optical microscopy; Polyethylene; Sorting; Velocity measurement; charge coupled device; data processing; defects inspection; field programmable gate array;
Conference_Titel :
Intelligent Computing and Intelligent Systems, 2009. ICIS 2009. IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-4754-1
Electronic_ISBN :
978-1-4244-4738-1
DOI :
10.1109/ICICISYS.2009.5358238
