Title :
Nonvolatile memristor memory: Device characteristics and design implications
Author :
Ho, Yenpo ; Huang, Garng M. ; Li, Peng
Author_Institution :
Dept. of ECE, Texas A&M Univ., College Station, TX, USA
Abstract :
The search for new nonvolatile universal memories is propelled by the need for pushing power-efficient nanocomputing to the next higher level. As a potential contender for the next-generation memory technology of choice, the recently found ¿the missing fourth circuit element¿, memristor, has drawn a great deal of research interests. In this paper, we characterize the fundamental electrical properties of memristor devices by encapsulating them into a set of compact closed-form expressions. Our derivations provide valuable design insights and allow a deeper understanding of key design implications of memristor-based memories. In particular, we investigate the design of read and write circuits and analyze data integrity and noise-tolerance issues.
Keywords :
electric properties; memristors; radiation hardening (electronics); semiconductor storage; closed-form expressions; memristor device electrical properties; nonvolatile memristor memory; nonvolatile universal memory; Capacitance; Circuit analysis; Circuit noise; Closed-form solution; Electric resistance; Flash memory; Memristors; Nonvolatile memory; Random access memory; Voltage;
Conference_Titel :
Computer-Aided Design - Digest of Technical Papers, 2009. ICCAD 2009. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-60558-800-1
Electronic_ISBN :
1092-3152