Title :
Operating system scheduling for efficient online self-test in robust systems
Author :
Li, Yanjing ; Mutlu, Onur ; Mitra, Subhasish
Author_Institution :
Stanford Univ., Stanford, CA, USA
Abstract :
Very thorough online self-test is essential for overcoming major reliability challenges such as early-life failures and transistor aging in advanced technologies. This paper demonstrates the need for operating system (OS) support to efficiently orchestrate online self-test in future robust systems. Experimental data from an actual dual quad-core system demonstrate that, without software support, online self-test can significantly degrade performance of soft real-time and computation-intensive applications (by up to 190%), and can result in perceptible delays for interactive applications. To mitigate these problems, we develop OS scheduling techniques that are aware of online self-test, and schedule/migrate tasks in multi-core systems by taking into account the unavailability of one or more cores undergoing online self-test. These techniques eliminate any performance degradation and perceptible delays in soft real-time and interactive applications (otherwise introduced by online self-test), and significantly reduce the impact of online self-test on the performance of computation-intensive applications. Our techniques require minor modifications to existing OS schedulers, thereby enabling practical and efficient online self-test in real systems.
Keywords :
built-in self test; operating systems (computers); scheduling; OS scheduling techniques; computation-intensive applications; dual quad-core system; early-life failures; multicore systems; online self-test; operating system scheduling; perceptible delays; performance degradation; robust systems; software support; transistor aging; Aging; Application software; Built-in self-test; Computer applications; Degradation; Delay; Operating systems; Processor scheduling; Robustness; Transistors;
Conference_Titel :
Computer-Aided Design - Digest of Technical Papers, 2009. ICCAD 2009. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-60558-800-1
Electronic_ISBN :
1092-3152