Title :
Resilient circuits — Enabling energy-efficient performance and reliability
Author :
Tschanz, James ; Bowman, Keith ; Wilkerson, Chris ; Lu, Shih-Lien ; Karnik, Tanay
Author_Institution :
Intel Labs., Intel Corp., Hillsboro, OR, USA
Abstract :
Voltage and frequency margins necessary to ensure correct processor operation under dynamic voltage, temperature, and aging variations result in performance and power overheads. Resilient circuit techniques, including embedded error-detection sequentials and tunable replica circuits, allow these margins to be reduced or eliminated, resulting in reliable, energy-efficient operation.
Keywords :
ageing; integrated circuit design; integrated circuit reliability; microprocessor chips; aging variation; circuit reliability; delay faults; dynamic voltage; embedded error detection sequential; energy efficient performance; error detection; error recovery; frequency margin; processor operation; resilient circuit technique; temperature variation; timing errors; tunable replica circuits; variation-tolerant circuits; voltage margin; Aging; Costs; Delay; Energy efficiency; Frequency; Integrated circuit reliability; Permission; Temperature sensors; Tunable circuits and devices; Voltage; Resilient circuits; adaptation; delay faults; dynamic variations; error detection; error recovery; parameter variations; timing errors; variation-tolerant circuits;
Conference_Titel :
Computer-Aided Design - Digest of Technical Papers, 2009. ICCAD 2009. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-60558-800-1
Electronic_ISBN :
1092-3152
