Resilient circuits — Enabling energy-efficient performance and reliability

Author

Tschanz, James ; Bowman, Keith ; Wilkerson, Chris ; Lu, Shih-Lien ; Karnik, Tanay

Author_Institution

Intel Labs., Intel Corp., Hillsboro, OR, USA

fYear

2009

fDate

2-5 Nov. 2009

Firstpage

71

Lastpage

73

Abstract

Voltage and frequency margins necessary to ensure correct processor operation under dynamic voltage, temperature, and aging variations result in performance and power overheads. Resilient circuit techniques, including embedded error-detection sequentials and tunable replica circuits, allow these margins to be reduced or eliminated, resulting in reliable, energy-efficient operation.

Keywords

ageing; integrated circuit design; integrated circuit reliability; microprocessor chips; aging variation; circuit reliability; delay faults; dynamic voltage; embedded error detection sequential; energy efficient performance; error detection; error recovery; frequency margin; processor operation; resilient circuit technique; temperature variation; timing errors; tunable replica circuits; variation-tolerant circuits; voltage margin; Aging; Costs; Delay; Energy efficiency; Frequency; Integrated circuit reliability; Permission; Temperature sensors; Tunable circuits and devices; Voltage; Resilient circuits; adaptation; delay faults; dynamic variations; error detection; error recovery; parameter variations; timing errors; variation-tolerant circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer-Aided Design - Digest of Technical Papers, 2009. ICCAD 2009. IEEE/ACM International Conference on

Conference_Location

San Jose, CA

ISSN

1092-3152

Print_ISBN

978-1-60558-800-1

Electronic_ISBN

1092-3152

Type

conf

Filename

5361314