Title :
Concentration of Measure Inequalities for Toeplitz Matrices With Applications
Author :
Sanandaji, Borhan M. ; Vincent, Tyrone L. ; Wakin, Michael B.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Colorado Sch. of Mines, Golden, CO, USA
Abstract :
We derive Concentration of Measure (CoM) inequalities for randomized Toeplitz matrices. These inequalities show that the norm of a high-dimensional signal mapped by a Toeplitz matrix to a low-dimensional space concentrates around its mean with a tail probability bound that decays exponentially in the dimension of the range space divided by a quantity which is a function of the signal. For the class of sparse signals, the introduced quantity is bounded by the sparsity level of the signal. However, we observe that this bound is highly pessimistic for most sparse signals and we show that if a random distribution is imposed on the non-zero entries of the signal, the typical value of the quantity is bounded by a term that scales logarithmically in the ambient dimension. As an application of the CoM inequalities, we consider Compressive Binary Detection (CBD).
Keywords :
Toeplitz matrices; compressed sensing; probability; signal detection; ambient dimension; compressive binary detection; high-dimensional signal; low-dimensional space concentrates; measure inequality concentration; nonzero entries; random distribution; randomized Toeplitz matrices; sparse signals; sparsity level; tail probability bound; Compressed sensing; Covariance matrix; Eigenvalues and eigenfunctions; Linear matrix inequalities; Sensors; Sparse matrices; Symmetric matrices; Compressive sensing; compressive Toeplitz matrices; concentration of measure inequalities;
Journal_Title :
Signal Processing, IEEE Transactions on
DOI :
10.1109/TSP.2012.2222384