• DocumentCode
    509061
  • Title

    Zapmem: A Framework for Testing the Effect of Memory Corruption Errors on Operating System Kernel Reliability

  • Author

    Drebes, Roberto Jung ; Nanya, Takashi

  • Author_Institution
    Res. Center for Adv. Sci. & Technol. (RCAST), Univ. of Tokyo, Tokyo, Japan
  • fYear
    2009
  • fDate
    16-18 Nov. 2009
  • Firstpage
    295
  • Lastpage
    300
  • Abstract
    While monolithic operating system kernels are composed of many subsystems, during runtime they all share a common address space, making fault propagation a serious issue. The code quality of each subsystem is different, as OS development is a complex task commonly divided by different groups with different degrees of expertise. Since the memory space into which this code runs is shared, the occurrence of bugs or errors in one of the subsystems may propagate to others and affect general OS reliability. It is necessary, then, to test how errors propagate between the different kernel subsystems and how they affect reliability. This work presents a simple new technique to inject memory corruption faults and Zapmem, a fault injection tool which uses such technique to test the effect on reliability from memory corruption of statically allocated kernel data. Zapmem associates the runtime memory addresses to the corresponding high level (source code) memory structure definitions, which indicate which kernel subsystem allocated that memory region, and the tool has minimal intrusiveness, as our technique does not require kernel instrumentation. The efficacy of our approach and preliminary results are also presented.
  • Keywords
    operating system kernels; software reliability; system recovery; OS development; Zapmem; Zapmem associates; fault injection tool; fault propagation; memory corruption errors; monolithic operating system kernels; operating system kernel reliability; Computer bugs; Hardware; Instruments; Kernel; Operating systems; Performance evaluation; Resource management; Runtime; Space technology; System testing; fault injection; memory corruption; operating system kernel; reliability estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Computing, 2009. PRDC '09. 15th IEEE Pacific Rim International Symposium on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-0-7695-3849-5
  • Type

    conf

  • DOI
    10.1109/PRDC.2009.53
  • Filename
    5369146