Title :
Analog Circuit Fault Diagnose Based on Wavelet Packet Transform and SOFM Neural Network
Author :
Xie, Tao ; He, Yigang ; Yao, Jiangang ; Deng, Xiao
Author_Institution :
Coll. of Electr. & Inf. Eng., Hunan Univ., ChangSha, China
Abstract :
This paper proposes a fault diagnosis method for analog circuits based on a combination of wavelet packet transformation and SOFM network, which uses wavelet packet decomposition as pre-processing and denoising tool for multi-scale decomposition and denoising on the sampling signal of electric circuit, and for energy feature extraction and normalization as sample input to the neural network. Neurons of SOFM network competitive layer are used in the fault identification and classification of the sampling data, which overcomes the disadvantage of difficult selection of BP network hidden neurons. This article presents a detailed description of the fault diagnosis principle and procedure, and examples of fault diagnosis are given.
Keywords :
analogue circuits; circuit testing; fault diagnosis; feature extraction; matrix decomposition; neural nets; self-organising feature maps; wavelet transforms; BP network hidden neurons; SOFM neural network; analog circuit fault diagnose; energy signal feature extraction; multiscale decomposition; sampling signal denoising; self organizing feature mapping; wavelet packet decomposition; wavelet packet transformation; Analog circuits; Circuit faults; Fault diagnosis; Feature extraction; Neural networks; Neurons; Noise reduction; Sampling methods; Wavelet packets; Wavelet transforms;
Conference_Titel :
Artificial Intelligence and Computational Intelligence, 2009. AICI '09. International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3835-8
Electronic_ISBN :
978-0-7695-3816-7
DOI :
10.1109/AICI.2009.104