Title :
Extraction of Characteristic Spectral Line Based on Gaussian Fitting Method
Author :
Pan, Jingchang ; Dong, Weixiang
Author_Institution :
Sch. of Inf. Eng., Shandong Univ. at Weihai, Weihai, China
Abstract :
Describes in detail the method to process the characteristics of the spectral lines using the Gaussian fitting based on the least-squares method. By separately truncating the peak area data and statistically analyzing and setting fitting parameters, multiple peaks overlap interference can be better avoided, and more accurate fitting of spectral characteristics of spectra of line center and intensity can be worked out. Experimental results show that the algorithm can effectively improve the fitting accuracy, and can make preparation for the calculation of Einstein shift and analysis of chemical elements in stars.
Keywords :
Gaussian processes; least squares approximations; spectral analysis; Einstein shift; Gaussian fitting method; characteristic spectral line extraction; chemical elements; least-squares method; multiple peaks overlap interference; peak area data; Algorithm design and analysis; Artificial intelligence; Chemical analysis; Computational intelligence; Data analysis; Data mining; Feature extraction; Gaussian distribution; Interference; Telescopes; Astronomical spectral; Characteristics of spectral line; Gaussian fitting; Least-squares method;
Conference_Titel :
Artificial Intelligence and Computational Intelligence, 2009. AICI '09. International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-3835-8
Electronic_ISBN :
978-0-7695-3816-7
DOI :
10.1109/AICI.2009.36
