• DocumentCode
    510796
  • Title

    The electrical properties of the diamond optoelectronic device

  • Author

    Zhang, Yi ; Wang, Lin-jun ; Huang, Jian ; Tang, Ke ; Zhang, Fengjuan ; Fang, Qian ; Zeng, Qingkai ; Xu, Run ; Zhang, Jijun ; Min, Jiahua ; Xia, Yiben

  • Author_Institution
    School of Materials Science and Engineering, Shanghai University, 200072, China
  • fYear
    2009
  • fDate
    2-6 Nov. 2009
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    200 εm thick free-standing polycrystalline diamond films were grown by microwave plasma chemical vapor deposition (MPCVD) method. The nucleation surfaces of diamond were characterized by XRD, Raman scattering, atomic force microscopy (AFM) method. An ultraviolet (UV) optoelectronic device was fabricated on diamond nucleation surface, showing clear modulation of channel current.
  • Keywords
    Atomic force microscopy; Chemical vapor deposition; Microwave devices; Microwave theory and techniques; Optoelectronic devices; Plasma chemistry; Plasma devices; Plasma properties; Raman scattering; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications and Photonics Conference and Exhibition (ACP), 2009 Asia
  • Conference_Location
    Shanghai, China
  • Print_ISBN
    978-1-55752-877-3
  • Electronic_ISBN
    978-1-55752-877-3
  • Type

    conf

  • Filename
    5377462