Title :
Plasma decay in air and N2:O2:CO2 mixtures at high gas temperatures
Author :
Aleksandrov, N.L. ; Kindysheva, S.V. ; Kosarev, I.N. ; Starikovskii, A.Y.
Author_Institution :
Moscow Inst. of Phys. & Technol., Moscow, Russia
Abstract :
Plasma decay after a high-voltage nanosecond discharge has been studied experimentally and numerically behind an incident or reflected shock wave in high temperature (600-2400 K) air and N2:O2:CO2 mixtures for pressures between 0.05 and 0.9 atm. Time -resolved electron density history was measured by a microwave interferometer for initial electron densities in the range (1-3) Ã 1012 cm-3 and the effective eeffective electron-ion recombination coefficientlectron-ion recombination coefficient was determined. A numerical simulation was carried out to describe the temporal evolution of the densities of charged and neutral particles under the conditions considered. It was shown that the loss of electrons in this case is determined by dissociative recombination with O2 + ions. Electron attachment to O2 to form negative ions is not important because of fast electron detachment in collisions with O atoms produced in the discharge.
Keywords :
carbon compounds; discharges (electric); dissociation; gas mixtures; interferometry; ion recombination; nitrogen; numerical analysis; oxygen; plasma collision processes; plasma density; plasma diagnostics; plasma shock waves; plasma simulation; N2-O2-CO2; O atoms; O2 + ions; air; collisions; dissociative recombination; effective electron-ion recombination coefficient; electron attachment; gas temperatures; high-voltage nanosecond discharge; incident shock wave; microwave interferometer; negative ions; neutral particles; numerical simulation; plasma decay; reflected shock wave; time-resolved electron density; Density measurement; Electrons; History; Microwave measurements; Numerical simulation; Plasma temperature; Plasma waves; Shock waves; Spontaneous emission; Time measurement;
Conference_Titel :
Gas Discharges and Their Applications, 2008. GD 2008. 17th International Conference on
Conference_Location :
Cardiff
Print_ISBN :
978-0-9558052-0-2