• DocumentCode
    511528
  • Title

    N-type SiGe heterostructures for THz intersubband transitions

  • Author

    De Seta, M. ; Capellini, G. ; Ciasca, G. ; Busby, Y. ; Evangelisti, F. ; Nicotra, G. ; Nardone, M. ; Ortolani, M. ; Virgilio, M. ; Grosso, G. ; Nucara, A. ; Calvani, P.

  • Author_Institution
    Dept. of Phys., Univ. Roma Tre, Rome, Italy
  • fYear
    2009
  • fDate
    26-30 July 2009
  • Firstpage
    513
  • Lastpage
    514
  • Abstract
    Research on band-gap engineering of Silicon-Germanium heterostructures for the realization of Quantum Cascade (QC) structures emitting in the Terahertz (THz) spectral region has recently attracted a vast interest. While several successful attempts have been reported using hole-based (p-type) intersubband transitions, very few results have been published on systems exploiting electrons (n-type). In this work we present the optical and structural characterization of n-type heterostructures made either of tensely-strained Si (sSi) quantum well (QW) confined between low Ge content Si1-xGex barriers [0.2<x<0.5] or of compressively-strained Ge (sGe) QW confined between high Ge content Si1-xGex barriers [0.8<x<0.9]. The structural and morphological characterizations of the samples have been made by atomic force microscopy (AFM), X-ray photoemission spectroscopy (XPS), transmission electron microscopy (TEM), and Raman spectroscopy. Intersubband transitions have been experimentally investigated by absorption spectroscopy and compared with the theoretical results of a tight-binding model, which provides the electronic band structure of the complete multi quantum well system throughout the whole Brillouin zone.
  • Keywords
    Ge-Si alloys; Raman spectra; X-ray photoelectron spectra; atomic force microscopy; band structure; semiconductor quantum wells; semiconductor thin films; silicon; tight-binding calculations; transmission electron microscopy; Brillouin zone; GeSi-Si; Raman spectroscopy; THz intersubband transitions; X-ray photoemission spectroscopy; atomic force microscopy; band-gap engineering; complete multi quantum well system; electronic band structure; hole-based intersubband transition; n-type silicon-germanium heterostructures; quantum cascade structures; systems exploiting electrons; tensely-strained Si quantum well; tight-binding model; transmission electron microscopy; Atomic force microscopy; Charge carrier processes; Electron optics; Germanium silicon alloys; Photonic band gap; Raman scattering; Silicon germanium; Spectroscopy; Stimulated emission; Transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2009. IEEE-NANO 2009. 9th IEEE Conference on
  • Conference_Location
    Genoa
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4244-4832-6
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • Filename
    5394721