• DocumentCode
    511542
  • Title

    Ultra-thin titanium nitride film epitaxy with hyperthermal titanium ions

  • Author

    Gerlach, Jürgen W. ; Höche, Thomas ; Neumann, Lena ; Rauschenbach, Bernd

  • Author_Institution
    Leibniz-Inst. fur Oberflachenmodifizierung (IOM), Leipzig, Germany
  • fYear
    2009
  • fDate
    26-30 July 2009
  • Firstpage
    571
  • Lastpage
    574
  • Abstract
    The growth of ultra-thin titanium nitride films by deposition of titanium ions, possessing hyperthermal energies of several ten electron volts, in a nitrogen ambient is investigated. The hyperthermal titanium ions were produced by a pulsed dc vacuum arc metal plasma source. The TiN films were deposited at substrate temperatures in the range from 700°C down to room temperature on MgO(100). The crystalline surface structure of the films was monitored in situ by reflection high energy electron diffraction. The crystallographic structure was investigated by X-ray diffraction. High resolution transmission electron microscopy was used to examine the morphology and defect structure of the films. An ultra-high vacuum scanning-probe microscope was used to investigate the surface topography of the films. The results show that all the ultra-thin TiN films deposited this way are epitaxial, even at room temperature, indicating the beneficial effect of the hyperthermal energy of the particles involved in the deposition process.
  • Keywords
    crystal defects; crystal structure; epitaxial layers; ion beam assisted deposition; reflection high energy electron diffraction; scanning probe microscopy; surface structure; surface topography; titanium compounds; transmission electron microscopy; vapour phase epitaxial growth; TiN; X-ray diffraction; crystalline surface structure; crystallographic structure; defect structure morphology; deposition process; film growth; high resolution transmission electron microscopy; hyperthermal energy; hyperthermal titanium ions; magnesium oxide(100) substrate; nitrogen ambient; pulsed dc vacuum arc metal plasma source; reflection high energy electron diffraction; surface topography; temperature 25 degC to 700 degC; temperature 293 K to 298 K; ultrahigh vacuum scanning-probe microscope; ultrathin titanium nitride film epitaxy; Electrons; Epitaxial growth; Hyperthermia; Nitrogen; Optical films; Plasma temperature; Temperature distribution; Tin; Titanium; X-ray diffraction; hyperthermal; ion beam assisted epitaxy; room temperature epitaxy; titanium nitride;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2009. IEEE-NANO 2009. 9th IEEE Conference on
  • Conference_Location
    Genoa
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4244-4832-6
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • Filename
    5394735