DocumentCode
511542
Title
Ultra-thin titanium nitride film epitaxy with hyperthermal titanium ions
Author
Gerlach, Jürgen W. ; Höche, Thomas ; Neumann, Lena ; Rauschenbach, Bernd
Author_Institution
Leibniz-Inst. fur Oberflachenmodifizierung (IOM), Leipzig, Germany
fYear
2009
fDate
26-30 July 2009
Firstpage
571
Lastpage
574
Abstract
The growth of ultra-thin titanium nitride films by deposition of titanium ions, possessing hyperthermal energies of several ten electron volts, in a nitrogen ambient is investigated. The hyperthermal titanium ions were produced by a pulsed dc vacuum arc metal plasma source. The TiN films were deposited at substrate temperatures in the range from 700°C down to room temperature on MgO(100). The crystalline surface structure of the films was monitored in situ by reflection high energy electron diffraction. The crystallographic structure was investigated by X-ray diffraction. High resolution transmission electron microscopy was used to examine the morphology and defect structure of the films. An ultra-high vacuum scanning-probe microscope was used to investigate the surface topography of the films. The results show that all the ultra-thin TiN films deposited this way are epitaxial, even at room temperature, indicating the beneficial effect of the hyperthermal energy of the particles involved in the deposition process.
Keywords
crystal defects; crystal structure; epitaxial layers; ion beam assisted deposition; reflection high energy electron diffraction; scanning probe microscopy; surface structure; surface topography; titanium compounds; transmission electron microscopy; vapour phase epitaxial growth; TiN; X-ray diffraction; crystalline surface structure; crystallographic structure; defect structure morphology; deposition process; film growth; high resolution transmission electron microscopy; hyperthermal energy; hyperthermal titanium ions; magnesium oxide(100) substrate; nitrogen ambient; pulsed dc vacuum arc metal plasma source; reflection high energy electron diffraction; surface topography; temperature 25 degC to 700 degC; temperature 293 K to 298 K; ultrahigh vacuum scanning-probe microscope; ultrathin titanium nitride film epitaxy; Electrons; Epitaxial growth; Hyperthermia; Nitrogen; Optical films; Plasma temperature; Temperature distribution; Tin; Titanium; X-ray diffraction; hyperthermal; ion beam assisted epitaxy; room temperature epitaxy; titanium nitride;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2009. IEEE-NANO 2009. 9th IEEE Conference on
Conference_Location
Genoa
ISSN
1944-9399
Print_ISBN
978-1-4244-4832-6
Electronic_ISBN
1944-9399
Type
conf
Filename
5394735
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